Extended Diffraction Imaging Technology - E.D.I.T.

TEEC announces its first results using the new E.D.I.T method for fracture enhancement and diffraction imaging. Based on the Common Reflection Surface
(CRS) theory, the stacking operator for diffraction events has been reformulated to enable a data-driven simultaneous search for diffraction attributes. These can be used to both, enhance diffractions, and perform a time migration. The E.D.I.Technology enhances subtle faults and lineaments in otherwise simple geology, which is of special interest in shale-gas exploration. The derivation of additional attributes, which directly relate to reservoir and gas production parameters is currently investigated and planned to be incorporated in near-future releases.

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